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Part Name
Description
CM1230(2010) View Datasheet(PDF) - ON Semiconductor
Part Name
Description
Manufacturer
CM1230
(Rev.:2010)
2, 4, and 8-Channel Low-Capacitance ESD Protection Array
ON Semiconductor
CM1230 Datasheet PDF : 16 Pages
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CM1230
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Standard test condition is IEC61000-4-2 level 4 test circuit with each (A /B ) pin subjected to ±12kV contact discharge for 1000 pulses. Discharges are timed at 1 second intervals and all 1000 strikes are completed in one
OUT OUT
continuous test run.
Rev.3 | Page 2 of 16 | www.onsemi.com
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