NE5550779A
TEST CIRCUIT SCHEMATIC FOR 157 MHz
VGS
VDS
IN
50 Ω C10
L10
C11
C12
R1
C1
L1
C1
C20
NE5550779A
L20
C21 C22
OUT
C23 50 Ω
COMPONENTS OF TEST CIRCUIT FOR MEASURING ELECTRICAL CHARACTERISTICS
Symbol
C1
C10
C11
C12
C20
C21
C22
C23
R1
<R>
L1
L10
L20
PCB
SMA Connecter
Value
1 μF
100 pF
5.6 pF
39 pF
22 pF
68 pF
15 pF
100 pF
5.1 kΩ
74.7 nH
27 nH
29.8 nH
−
−
Type
GRM31MB11E105KA01
GQM1882C1H101JB01
GQM1882C2A5R6DB01
GQM1882C1H390JB01
GRM1882C1H220JA01
GQM1882C1H680JB01
GQM1882C1H150JA01
GQM1882C1H101JB01
1/10 W Chip Resistor
MCR03J103
φ 0.4 mm, φ D = 2 mm, 10 Turns
LLQ2012-F27N
φ 0.4 mm, φ D = 2 mm, 5 Turns
R1766, t = 0.4 mm, εr = 4.5, size = 30 × 48 mm
WAKA 01K0790-20
Maker
Murata
Murata
Murata
Murata
Murata
Murata
Murata
Murata
ROAM
Ohesangyou
Toko
Ohesangyou
Panasonic
WAKA
R09DS0040EJ0300 Rev.3.00
Mar 12, 2013
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