MCP4021/2/3/4
AC/DC CHARACTERISTICS (CONTINUED)
Electrical Specifications: Unless otherwise indicated, all parameters apply across the specified operating ranges.
TA = -40°C to +125°C, 2.1 kΩ, 5 kΩ, 10 kΩ and 50 kΩ devices. Typical specifications represent values for VDD = 5.5V, VSS = 0V,
TA = +25°C.
Parameters
Sym
Min
Typ
Max
Units
Conditions
Digital Inputs/Outputs (CS, U/D)
Input High Voltage
VIH
0.7 VDD
—
—
V
Input Low Voltage
High-Voltage Input Entry Voltage
VIL
—
VIHH
8.5
High-Voltage Input Exit Voltage
VIHH
—
CS Pull-up/Pull-down Resistance
RCS
—
CS Weak Pull-up/Pull-down Current
IPU
—
Input Leakage Current
IIL
-1
CS and U/D Pin Capacitance
CIN, COUT —
RAM (Wiper) Value
—
0.3 VDD
V
—
12.5(6)
V Threshold for WiperLock™
Technology
—
VDD+0.8(6)
V
16
—
kΩ VDD = 5.5V, VCS = 3V
170
—
µA VDD = 5.5V, VCS = 3V
—
1
µA VIN = VDD
10
—
pF fC = 1 MHz
Value Range
N
0h
—
3Fh
hex
EEPROM
Endurance
Endurance
—
1M
—
Cycles
EEPROM Range
N
0h
—
3Fh
hex
Initial Factory Setting
N
1Fh
hex WiperLock Technology = Off
Power Requirements
Power Supply Sensitivity
(MCP4021 and MCP4023 only)
PSS
—
0.0015 0.0035
%/% VDD = 4.5V to 5.5V, VA = 4.5V,
Code = 1Fh
—
0.0015 0.0035
%/% VDD = 2.7V to 4.5V, VA = 2.7V,
Code = 1Fh
Note 1:
2:
3:
4:
Resistance is defined as the resistance between terminal A to terminal B.
INL and DNL are measured at VW with VA = VDD and VB = VSS. (-202 devices VA = 4V).
MCP4021/23 only, test conditions are: IW = 1.9 mA, code = 00h.
MCP4022/24 only, test conditions are:
Device
Resistance
Current at Voltage
5.5V
2.7V
Comments
2.1 kΩ
5 kΩ
10 kΩ
50 kΩ
2.25 mA
1.4 mA
450 µA
90 µA
1.1 mA
450 µA
210 µA
40 µA
MCP4022 includes VWZSE
MCP4024 includes VWFSE
5: Resistor terminals A, W and B’s polarity with respect to each other is not restricted.
6: This specification by design
7: Non-linearity is affected by wiper resistance (RW), which changes significantly over voltage and temperature. See
Section 6.0 “Resistor” for additional information.
8: The MCP4021 is externally connected to match the configurations of the MCP4022 and MCP4024, and then tested.
© 2006 Microchip Technology Inc.
DS21945E-page 5