ADS1225
ADS1226
SBAS346 – MAY 2006
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
ORDERING INFORMATION
For the most current package and ordering information, see the Package Option Addendum located at the end
of this data sheet or see the TI web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
Over operating free-air temperature range (unless otherwise noted)(1)
AVDD to GND
DVDD to GND
Input current
Analog input voltage to GND
Digital input voltage to GND
Maximum junction temperature
Operating temperature range
Storage temperature range
ADS1225, ADS1226
–0.3 to +6
–0.3 to +6
100, momentary
10, continuous
–0.3 to AVDD +0.3
–0.3 to to AVDD +0.3
+150
–55 to +125
–50 to +150
UNIT
V
V
mA
mA
V
V
°C
°C
°C
(1) Stresses above these ratings may cause permanent damage. Exposure to absolute maximum conditions for extended periods may
degrade device reliability. These are stress ratings only, and functional operation of the device at these or any other conditions beyond
those specified is not implied.
2
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