M27W256 View Datasheet(PDF) - STMicroelectronics
Part Name
Description
Manufacturer
M27W256 Datasheet PDF : 15 Pages
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M27W256
Table 7. Read Mode DC Characteristics (1)
(TA = –40 to 85°C; VCC = 2.7V to 3.6V; VPP = VCC)
Symbol
Parameter
Test Condition
Min
ILI
Input Leakage Current
ILO Output Leakage Current
ICC Supply Current
ICC1 Supply Current (Standby) TTL
ICC2 Supply Current (Standby) CMOS
IPP Program Current
0V ≤ VIN ≤ VCC
0V ≤ VOUT ≤ VCC
E = VIL, G = VIL,
IOUT = 0mA, f = 5MHz,
VCC ≤ 3.6V
E = VIH
E > VCC – 0.2V,
VCC ≤ 3.6V
VPP = VCC
VIL
Input Low Voltage
–0.6
VIH (2) Input High Voltage
0.7 VCC
VOL Output Low Voltage
IOL = 2.1mA
VOH Output High Voltage TTL
IOH = –400µA
2.4
Note: 1. VCC must be applied simultaneously with or before VPP and removed simultaneously or after VPP.
2. Maximum DC voltage on Output is VCC +0.5V.
Max
±10
±10
15
1
15
100
0.2 VCC
VCC + 0.5
0.4
Unit
µA
µA
mA
mA
µA
µA
V
V
V
V
Table 8. Read Mode AC Characteristics (1)
(TA = –40 to 85°C; VCC = 2.7V to 3.6V; VPP = VCC)
M27W256
Symbol Alt
Parameter
Test
Condition
-80 (3)
-100
(-120/-150/-200)
VCC = 3.0V to 3.6V VCC = 2.7V to 3.6V VCC = 2.7V to 3.6V
Unit
Min Max Min Max Min Max
tAVQV
tACC
Address Valid to
Output Valid
E = VIL,
G = VIL
70
80
100 ns
tELQV
tCE
Chip Enable Low to
Output Valid
G = VIL
70
80
100 ns
tGLQV
tOE
Output Enable Low
to Output Valid
E = VIL
40
50
60
ns
tEHQZ (2)
tDF
Chip Enable High
to Output Hi-Z
G = VIL
0
40
0
50
0
60
ns
tGHQZ (2)
tDF
Output Enable High
to Output Hi-Z
E = VIL
0
40
0
50
0
60
ns
tAXQX
tOH
Address Transition
to Output Transition
E = VIL,
G = VIL
0
0
0
ns
Note: 1. VCC must be applied simultaneously with or before VPP and removed simultaneously or after VPP.
2. Sampled only, not 100% tested.
3. Speed obtained with High Speed AC measurement conditions.
5/15
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