CLP270M View Datasheet(PDF) - STMicroelectronics
Part Name
Description
Manufacturer
CLP270M Datasheet PDF : 24 Pages
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TEST CIRCUIT FOR ISWOFF PARAMETER : GO-NO GO TEST
CLP270M
R
VBAT = - 48 V
D.U.T.
- VP
Surge
generator
This is a GO-NO GO test which allows to confirm the switch-off (ISWOFF) level in a functional test circuit.
TEST PROCEDURE :
- Adjust the current level at the ISWOFF value by short circuiting the D.U.T.
- Fire the D.U.T. with a surge current : IPP = 10A, 10/1000µs.
- The D.U.T. will come back to the OFF-state within a duration of 50ms max.
Fig. 26: Typical relative variation of switching-on cur-
rent (positive or negative) versus RSENSE resistor and
junction temperature (see test condition Fig. 28).
ISWON (T, Rsense) / ISWON (25°C, 4 Ω)
2
@-20°C @25°C @75°C
1
0.5
0.3
0.2
3
5
7
Rsense (Ω)
9 11 13
Fig. 27: Variation of switching-on current versus
RSENSE at 25°C.
Iswon @ 25°C (mA)
500
300
Iswon min Iswon max Iswon min Iswon max
negative negative positive positive
200
100
50
3
5
7
9 11
Rsense (Ω)
Fig. 28: ISWON MEASUREMENT
- Iswon = I1 when the CLP270M switches on (I1 is
progressively increased using R)
- Both TIP and RING sides of the CLP270M are
checked
- RL = 10 Ω.
RL
R sense
I1
± 48 V
TIPL TIPS
R
DUT GND
RINGL RINGS
Fig. 29: Relative variation of switching-off current
versus junction temperature for RSENSE between 3
and 10 Ω.
ISWOFF [Tj°C] / ISWOFF [25°C]
2.0
1.8
1.6
1.4
1.2
1.0
0.8
0.6
0.4
-40 -20
0
20 40 60 80
Tj (°C)
17/24
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