CY7C9335A View Datasheet(PDF) - Cypress Semiconductor
Part Name
Description
Manufacturer
CY7C9335A Datasheet PDF : 8 Pages
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CY7C9335A
Maximum Ratings[1]
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ..................................... −40°C to +125°C
Supply Voltage to Ground Potential .................−0.5V to +7.0V
DC Voltage Applied to Outputs
in High-Z State .....................................................−0.5V to +7.0V
Output Current Into Outputs.........................................16 mA
DC Input Voltage ................................................ −0.5V to +7.0V
Static Discharge Voltage ..............................................> 2001 V
(per MIL-STD-883, Method 3015)
Latch-up Current ..........................................................> 200 mA
Operating Range
Range
Commercial
Ambient Temperature
0°C to +70°C
VCC
5V ± 5%
Electrical Characteristics Over the Operating Range
Parameter
Description
VOH
Output HIGH Voltage
VOL
Output LOW Voltage
VIH
Input HIGH Voltage
VIL
Input LOW Voltage
IIX
Input Load Current
IOZ
Output Leakage Current
IOS
Output Short Circuit Current[3,4]
Capacitance[4]
Test Conditions
IOH = −3.2 mA, VCC = Min.
IOL = 16.0 mA, VCC = Min
Note 2
Note 2
GND ≤ VI ≤ VCC
GND ≤ VO ≤ VCC, Output Disabled
VCC = Max., VOUT = 0.5V
Min.
2.4
2.0
−0.5
−10
−50
−30
Max.
Unit
V
0.5
V
7.0
V
0.8
V
+10
µA
+50
µA
−160
mA
Parameter
CIN
COUT
CCLK
Description
Input Capacitance
Output Capacitance
Clock Signal Capacitance
Test Conditions
f = 1 MHz, VCC = 5.0V
Max.
Unit
10
pF
12
pF
12
pF
AC Test Loads and Waveforms
238Ω
5V
OUTPUT
35 pF
INCLUDING
JIG AND
SCOPE
(a)
170Ω
5V
OUTPUT
238Ω
5 pF
INCLUDING
JIG AND
SCOPE
(b)
Equivalent to: THÉVENIN EQUIVALENT
170Ω
5.0V
GND
<2 ns
ALL INPUT PULSES
90%
10%
90%
10%
<2 ns
(c)
OUTPUT
99Ω
2.08V
5 OR 35 pF
Notes:
1. Single Power Supply: The voltage on any input or I/O pin cannot exceed the power pin during power-up.
2. These are absolute values with respect to device ground. All overshoots with respect to system or tester noise are included.
3. Not more than one output should be tested at a time. Duration of the short circuit should not exceed 1 second. VOUT = 0.5V has been chosen to avoid test problems
caused by tester ground degradation.
4. Tested initially and after any design or process changes that may effect these parameters.
Document #: 38-02083 Rev. **
Page 5 of 8
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