EEPROM RELIABILITY
SPECIFICATION:
PARAMETER
SYMBOL
Copy to EEPROM Time
EEPROM Copy Endurance
EEPROM Data Retention
tEEC
NEEC
tEEDR
MIN
25,000
4
DS2720
(-20°C to +70°C, 2.5V £ VDD £ 5.5V)
TYP
MAX UNITS NOTES
1
5
ms
cycles
years
NOTES
1. All voltages are referenced to VSS.
2. Specified with no resistive load on CC, DC, or CP.
3. Contact the factory for different voltage trip points and delay periods.
4. Typical load capacitance on CC, DC is 1000pF CP (charge pump reservoir cap) = 0.1mF. DC load
total on CC, DC, CP > 10MW.
5. RTST = |VPLS - VDD| / I measured, with VPLS = 3.2V, VDD = 3.6V when test current, ITST, active for
RTST1 ; and VPLS = 4.0V, VDD = 2.5V when recovery charging for RTST2.
6. Maximum high-to-low fall time is 5ms.
7. Internal 10V clamp on DC pin limits DC output logic low when PLS > 10V
8. Short-circuit delay tested with VDD ramped from 3.1V to 1.9V in 5ms. Delay measured from VDD =
2.5V to DC pin fall to 7V from VOHCP.
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