DatasheetQ Logo
Electronic component search and free download site. Transistors,MosFET ,Diode,Integrated circuits

GX434 View Datasheet(PDF) - Gennum -> Semtech

Part Name
Description
Manufacturer
GX434
Gennum
Gennum -> Semtech 
GX434 Datasheet PDF : 9 Pages
1 2 3 4 5 6 7 8 9
10 mV/div
0.1 V/div
0.5 µs/div
Fig.3 Switching Transient (crosspoint to crosspoint)
Chip disabled crosstalk = 20 log
VIN
VOUT
VOUT
ENABLED
VIN
CROSSPOINT
37.5
Fig. 5 Chip Disabled Crosstalk Test Circuit
1 µs/div
Fig. 4 Switching Envelope (crosspoint to crosspoint)
All hostile crosstalk = 20 log
RIN
VOUT
VIN
VOUT
VIN
R
L
10
k
Fig. 6 All Hostile Crosstalk Test Circuit
BLANKING LEVEL
10 µH
10 µH
LUMINANCE LEVEL
8V
CONTROL BIT
FROM I/O PORT
R.F. SIGNAL
SOURCE
75
3.9 k
220
RELAY SWITCH
150
0.1µF
AC
COUPLING
150
DUT
R
L
CL
BUFFER
AMP
x2
75
75
Fig. 7 Differential Phase and Gain Test Circuit
DIFFERENTIAL GAIN AND PHASE TEST CIRCUIT
The test circuit of Figure 7 allows two DC bias levels, set by
the user, to be superimposed on a high frequency signal
source. A computer controlled relay selects either the preset
blanking or luminance level. One measurement is taken at
each level and the change in gain or phase is calculated.
This procedure is repeated one hundred times to provide a
reasonably large sample.
The results are averaged to reduce the standard deviation
and therefore improve the accuracy of the measurement.
The output from the device under test is AC coupled to a
buffer amplifier which allows the buffer to operate at a
constant luminance level so that it does not contribute any dg
or dp to the measurement.
510 -34 -2
6

Share Link: 

datasheetq.com  [ Privacy Policy ]Request Datasheet ] [ Contact Us ]