IDT71216
BiCMOS 16K x 15 CACHE-TAG RAM
AC TEST CONDITIONS
Input Pulse Levels
Input Rise/Fall Times
Input Timing Reference Levels
Output Timing Reference Levels
AC Test Load
AC TEST LOADS
GND to 3.0V
3ns
1.5V
1.5V
See Figs. 1, 2, 3, & 4
3067 tbl 16
Outputs
347 Ω
VCCQ
893 Ω
30pF *
COMMERCIAL TEMPERATURE RANGE
Tag I/O
347 Ω
VCCQ
893 Ω
50pF *
Figure 1. AC Test Load
3067 drw 03
Figure 2. Tag I/O AC Test Load
* Including scope and jig capacitance
3067 drw 04
Tag I/O
and
Outputs
347 Ω
VCCQ
893 Ω
5pF*
Figure 3. AC Test Load
(for tHZ and tLZ parameters )
* Including scope and jig capacitance
6
5
4
∆t 3
(Typical, ns)
2
3067 drw 05
1
20 30 50
80 100
∆ Capacitance (pF)
3067 drw 06
Figure 4. Lumped Capacitance Load, Typical Derating
14.3
10