LH28F320BFHE-PTTLZ1 View Datasheet(PDF) - Sharp Electronics

Part Name

Description

Manufacturer

LH28F320BFHE-PTTLZ1

32M (x16) Flash Memory

Sharp Electronics 

LHF32FD1

18

1.2.1 Capacitance(1) (TA=+25°C, f=1MHz)

Parameter

Symbol

Input Capacitance

CIN

Output Capacitance

COUT

NOTE:

1. Sampled, not 100% tested.

Condition

VIN=0.0V

VOUT=0.0V

Min.

Typ.

Max.

Unit

4

7

pF

6

10

pF

1.2.2 AC Input/Output Test Conditions

VCCQ

INPUT

VCCQ/2

TEST POINTS

VCCQ/2 OUTPUT

0.0

AC test inputs are driven at VCCQ(min) for a Logic "1" and 0.0V for a Logic "0".

Input timing begins, and output timing ends at VCCQ/2. Input rise and fall times (10% to 90%) < 5ns.

Worst case speed conditions are when VCC=VCC(min).

Figure 5. Transient Input/Output Reference Waveform for VCC=2.7V-3.6V

VCCQ(min)/2

1N914

DEVICE

UNDER

TEST

CL Includes Jig

Capacitances.

RL=3.3k

OUT

CL

Table 13. Configuration Capacitance Loading Value

Test Configuration

VCC=2.7V-3.6V

CL (pF)

50

Figure 6. Transient Equivalent Testing Load Circuit

Rev. 2.44

Share Link: