ABT22V10A5 View Datasheet(PDF) - Philips Electronics

Part Name

Description

Manufacturer

ABT22V10A5

5V high-speed universal PLD device with live insertion capability

Philips Electronics 

Philips Semiconductors

5V high-speed universal PLD device

with live insertion capability

Product specification

ABT22V10A5, A7

DC ELECTRICAL CHARACTERISTICS

Over operating ranges.

SYMBOL

PARAMETER

TEST CONDITIONS1

LIMITS

MIN

MAX

UNIT

Input voltage

VIL

Low

VIH

High

VI

Clamp

Output voltage

VCC = MIN

VCC = MAX

VCC = MIN, IIN = –18mA

0.8

V

2.0

V

–1.2

V

VOH

High-level output voltage

VOL

Low-level output voltage

Input current

VCC = MIN

VI = VIH or VIL

VCC = MIN

VI = VIH or VIL

IOH = –32mA

IOH = –16mA

IOL = 48mA

2.0

V

2.4

V

0.5

V

IIL

Low

IIH

High

II

Max input current

Output current

VCC = MAX, VIN = 0.4V

VCC = MAX, VIN = 2.7V

VCC = MAX, VIN = 5.5V

–10

µA

10

µA

20

µA

IPU/PD

Power-up/down 3-State

output current4

VCC <2.1V; VO = 0.5V to VCC;

VI = GND or VCC; OE/OE = X

50

µA

VCC = MAX

IOZH

IOZL

ISC

Output leakage2

Output leakage2

Short circuit3

VIN = VIL or VIH, VOUT = 2.7V

VIN = VIL or VIH, VOUT =0.4V

VOUT = 0.5V

20

µA

–20

µA

–30

–220

mA

ICC

VCC supply current

VCC = MAX, Outputs enabled, VI = VCC or GND; IO = 0

200

mA

Ground Bounce

TYP

MAX

UNIT

VOLP

Minimum dynamic VOH 5

VCC = MAX, 25°C

CL = 50pF (including jig capacitance)

1.0

1.2

V

NOTES:

1. These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.

2. I/O pin leakage is the worst case of IOZX or IIX (where X = H or L).

3. No more than one output should be tested at a time. Duration of the short-circuit test should not exceed one second. VOUT = 0.5V has been

chosen to avoid test problems caused by tester ground degradation.

4. This parameter is valid for any VCC between 0V and 1.2 V with a transition time up to 10 mS. From VCC = 1.2 to VCC = 5.0V ±0.25V a

transition time of 100 µS is permitted. X = Don’t care.

5. Guaranteed by design, but not tested. Measured holding one output (the output under test) Low and simultaneously switching all remianing

output from a High to a Low state. Switch S1 is closed; 50pF load.

1996 Dec 16

4

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