MC145010ED View Datasheet(PDF) - Freescale Semiconductor
Part Name
Description
Manufacturer
MC145010ED Datasheet PDF : 12 Pages
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Table 4. Pin Description (Continued)
Pin Symbol
Description
16
TEST This input has an on-chip pull-down device and is used to manually invoke a test mode. The Push Button Test mode is
initiated by a high level at pin 16 (usually depression of a S.P.S.T. normally-open push button switch to VDD). After one
oscillator cycle, IRED pulses approximately every 336 ms, regardless of the presence of smoke. Additionally, the amplifier
gain is increased by automatic selection of C1. Therefore, the background reflections in the smoke chamber may be
interpreted as smoke, generating a simulated-smoke condition. After the second IRED pulse, a successful test activates
the horn-driver and I/O circuits. The active I/O allows remote signaling for system testing. When the Push Button Test
switch is released, the Test input returns to VSS due to the on-chip pull-down device. After one oscillator cycle, the amplifier
gain returns to normal, thereby removing the simulated-smoke condition. After two additional IRED pulses, less than a
second, the IC exits the alarm mode and returns to standby timing.
1.04
1.02
Pulse width of IRED
1.00
Period or pulse width
of other parameters
0.98
0.96
6.0
1.02
7.0
8.0
9.0 10.0 11.0 12.0
VDD, Power Supply Voltage (V)
Figure 3. AC Characteristics vs. Supply
1.01
1.00
0.99
0.98
-10
Pulse width of IRED
Period or pulse width
of other parameters
VDD = 9.0 V
0
10 20
30 40 50 60
TA, Ambient Temperature (°C)
Figure 4. AC Characteristics vs. Temperature
1.03
1.02
1.01
1.00
0.99
0.98
-10
10 MΩ Carbon composition
100 kΩ Metal Film
1500 pF Dipped MICA
0
10 20 30 40
50 60
TA, Ambient Temperature (°C)
Note: These components were used to generate
Figure 3.
Figure 5. RC Component Variation Overtemperature
MC145010
6
Sensors
Freescale Semiconductor
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