MCP2120
4.0 ELECTRICAL CHARACTERISTICS
Absolute Maximum Ratings†
Ambient Temperature under bias ........................................................................................................... –40°C to +125°C
Storage Temperature ............................................................................................................................. –65°C to +150°C
Voltage on VDD with respect to VSS .....................................................................................................................0 to +7V
Voltage on RESET with respect to VSS .............................................................................................................0 to +14V
Voltage on all other pins with respect to VSS ................................................................................. –0.6V to (VDD + 0.6V)
Total Power Dissipation (1) ...................................................................................................................................700 mW
Max. Current out of VSS pin ..................................................................................................................................150 mA
Max. Current into VDD pin .....................................................................................................................................125 mA
Input Clamp Current, IIK (VI < 0 or VI > VDD) ................................................................................................................... ±20 mA
Output Clamp Current, IOK (V0 < 0 or V0 > VDD)............................................................................................................. ±20 mA
Max. Output Current sunk by any Output pin..........................................................................................................25 mA
Max. Output Current sourced by any Output pin.....................................................................................................25 mA
Note 1: Power Dissipation is calculated as follows:
PDIS = VDD x {IDD - ∑ IOH} + ∑ {(VDD-VOH) x IOH} + ∑(VOL x IOL)
†NOTICE: Stresses above those listed under "Maximum Ratings" may cause permanent damage to the device. This
is a stress rating only and functional operation of the device at those or any other conditions above those indicated in
the operation listings of this specification is not implied. Exposure to maximum rating conditions for extended periods
may affect device reliability.
© 2007 Microchip Technology Inc.
DS21618B-page 11