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NE56632-XX View Datasheet(PDF) - Philips Electronics

Part Name
Description
Manufacturer
NE56632-XX Datasheet PDF : 16 Pages
First Prev 11 12 13 14 15 16
Philips Semiconductors
Active-LOW system reset with adjustable delay time
Product data
NE56632-XX
TEST CIRCUITS
VCC1
RL
S1
A1
10 µF
/10 V
V1
5
4
NE56632-XX
CD
S3
1
2
3
S2
V2
A2
VCC2
Figure 27. Test circuit 1.
SL01608
INPUT
PULSE
5
4
RL
NE56632-XX
1
2
3
CL
100 pF
CD
10 µF
/10 V
CRT
5.0 V
Figure 28. Test circuit 2.
SL01609
VS(typ) – 0.4 V
VS(typ) + 0.4 V
0V
Figure 29. Input pulse.
NOTES:
A = DC amperemeter
V = DC voltmeter
CRT = oscilloscope
SL01610
2002 Mar 25
12

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