ZR431G-7 View Datasheet(PDF) - Diodes Incorporated.
Part Name
Description
Manufacturer
ZR431G-7 Datasheet PDF : 9 Pages
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ZR431
ADJUSTABLE PRECISION ZENER SHUNT REGULATOR
DC Test Circuits
IL
Input
VZ
IZ
IREF
VREF
IL
Input
R1 IREF
R2
VREF
VZ
IZ
Input
VZ
IZOFF
Fig. 1 Test Circuit for VZ = VREF
Fig. 2 Test Circuit for VZ > VREF
Fig.3 Test Circuit for Off State Current
Deviation of reference input voltage, VDEV, is defined as the maximum variation of the reference input voltage over the full
temperature range.
The average temperature coefficient of the reference input voltage, VREF is defined as:
VMAX
VMIN
VDEV = VMAX - VMIN
Vref (ppm /o C) =
Vdev × 1000000
Vref (T1− T2)
The dynamic output impedance, RZ is defined as:
Rz
=
ΔVz
ΔI z
When the device is programmed with two external resistors,
R1 and R2, (Fig 2), the dynamic output impedance of the
overall circuit, R’, is defined as:
R′
=
R z (1
+
R1 )
R2
T1
Temperature
T2
ZR431
Document number: DS33255 Rev. 6 - 2
3 of 9
www.diodes.com
October 2011
© Diodes Incorporated
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