Electrical specifications
VNQ5E160AK-E
Table 7. Logic Inputs
Symbol
Parameter
Test conditions
Min. Typ. Max. Unit
VIL
IIL
VIH
IIH
VI(hyst)
VICL
VCSDL
ICSDL
VCSDH
ICSDH
VCSD(hyst)
VCSCL
Table 8.
Symbol
Input low level voltage
Low level input current
Input high level voltage
VIN= 0.9V
High level input current
Input hysteresis voltage
VIN= 2.1V
Input clamp voltage
CS_DIS low level voltage
IIN= 1mA
IIN= -1mA
Low level CS_DIS current
CS_DIS high level voltage
VCSD= 0.9V
High level CS_DIS current
CS_DIS hysteresis voltage
VCSD= 2.1V
CS_DIS clamp voltage
ICSD= 1mA
ICSD= -1mA
Protections and diagnostics (1)
Parameter
Test conditions
0.9
V
1
µA
2.1
V
10 µA
0.25
V
5.5
7
V
-0.7
0.9
V
1
µA
2.1
V
10 µA
0.25
V
5.5
7
V
-0.7
Min. Typ. Max. Unit
IlimH DC short circuit current
VCC= 13V
5V<VCC<28V
IlimL
Short circuit current
during thermal cycling
VCC= 13V; TR<Tj<TTSD
7
10
14
A
14
A
2.5
A
TTSD
TR
TRS
Shutdown temperature
Reset temperature
Thermal reset of
STATUS
150 175 200 °C
TRS + 1 TRS + 5
°C
135
°C
THYST
Thermal hysteresis
(TTSD-TR)
7
°C
VDEMAG
Turn-off output voltage
clamp
IOUT= 1A; VIN= 0; L= 20mH VCC-41 VCC-46 VCC-52
V
Output voltage drop
VON limitation
IOUT= 0.03A;
Tj= -40°C...150°C
(see Figure 8.)
25
mV
1. To ensure long term reliability under heavy overload or short circuit conditions, protection and related
diagnostic signals must be used together with a proper software strategy. If the device is subjected to
abnormal conditions, this software must limit the duration and number of activation cycles.
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