ST8024LCTR View Datasheet(PDF) - STMicroelectronics
Part Name
Description
Manufacturer
ST8024LCTR Datasheet PDF : 35 Pages
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Electrical characteristics
ST8024L
Table 8. Card supply voltage characteristics (continued)
Symbol
Parameter(1)
Test conditions
Min. Typ. Max. Unit
VCC = 0 to 5 V
80
|ICC|
VCC = 0 to 3 V
Card supply current
VCC = 0 to 1.8 V
65
mA
45
VCC short-circuit to GND
90
120
SR
Slew rate
Slew up or down, VCC = 5 V; 3 V; 1.8 V;
|ICC| < 30 mA
0.08 0.15 0.22 V/µs
1. VDD = 3.3 V, VDDP = 5 V, fXTAL = 10 MHz, unless otherwise noted. Typical values are at TA = 25 °C. (All parameters remain
within limits but are tested only statistically for the temperature range. When a parameter is specified as a function of VDD or
VCC it means their actual value at the moment of measurement.)
2. To meet these specifications, pin VCC should be decoupled to CGND using two 100 nF ceramic multilayer capacitors of
max. 350 mΩ ESR. If VCC slew rate is not critical, the capacitance value can be up to 400 nF. (See Figure 10).
Table 9. Crystal connection (pins XTAL1 and XTAL2)
Symbol
Parameter(1)
Test conditions
Min. Typ. Max. Unit
CXTAL1,2
External capacitance
on pins XTAL1,
Depends on type of crystal or resonator used
XTAL2
-
15 pF
fXTAL
fXTAL1
Crystal frequency
Frequency applied on
pin XTAL1
2
-
26 MHz
0
-
26 MHz
VIH
High level input
voltage on pin XTAL1
VIL
Low level input
voltage on pin XTAL1
0.7
VDD
-
-0.3
-
1. VDD = 3.3 V, VDDP = 5 V, fXTAL = 10 MHz, unless otherwise noted. Typical values are at TA = 25 °C.
VDD
+0.3
V
+0.3
VDD
V
Table 10. Data lines (pins I/O, I/OUC, AUX1, AUX2, AUX1UC, and AUX2UC)
Symbol
Parameter(1)
Test conditions
Min. Typ. Max. Unit
tD(I/O-I/OUC),
tD(I/OUC-I/O)
I/O to I/OUC, I/OUC
to I/O falling edge
delay
tPU
Active pull-up pulse
width
fI/O(MAX)
Maximum frequency
on data lines
CI
Input capacitance on
data lines
-
-
200 ns
-
-
100 ns
-
-
1 MHz
-
-
10 pF
1. VDD = 3.3 V, VDDP = 5 V, fXTAL = 10 MHz, unless otherwise noted. Typical values are at TA = 25 °C.
12/35
Doc ID 17709 Rev 5
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