MJE13009 View Datasheet(PDF) - ON Semiconductor
Part Name
Description
Manufacturer
MJE13009 Datasheet PDF : 10 Pages
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MJE13009
Table 1. Test Conditions for Dynamic Performance
REVERSE BIAS SAFE OPERATING AREA AND INDUCTIVE SWITCHING
5V
PW
DUTY CYCLE ≤ 10% 68
tr, tf ≤ 10 ns
+5 V
0.001 mF
1N4933 33
MJE210
33 1N4933
2N2222
1
k
1
+5 Vk
RB
IB
VCC
L
IC
1N4933
NOTE
0.02 mF 270
PW and VCC Adjusted for Desired IC
RB Adjusted for Desired IB1
1k
2N2905
47 100
1/2 W
D.U.T.
MJE200
− VBE(off)
MR826*
Vclamp
*SELECTED FOR ≥ 1 kV
5.1 k
VCE
51
Coil Data:
Ferroxcube Core #6656
Full Bobbin (~16 Turns) #16
GAP for 200 mH/20 A
Lcoil = 200 mH
IC
ICM
t1
VCE
VCEM
TIME
OUTPUT WAVEFORMS
tf CLAMPED
tf UNCLAMPED ≈ t2
t
tf
t1 ADJUSTED TO
OBTAIN IC
t1 ≈
Lcoil (ICM)
VCC
Vclamp
t2
t2 ≈
Lcoil (ICM)
Vclamp
VCC = 20 V
Vclamp = 300 Vdc
Test Equipment
Scope−Tektronics
475 or Equivalent
RESISTIVE
SWITCHING
+125 V
RC
TUT
RB
SCOPE
D1
−4.0
V
VCC = 125 V
RC = 15 W
D1 = 1N5820 or Equiv.
RB = W
+10 V
25 ms
0
−8 V
tr, tf < 10 ns
Duty Cycle = 1.0%
RB and RC adjusted
for desired IB and IC
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