NE1617ADS,118 View Datasheet(PDF) - NXP Semiconductors.
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NE1617ADS,118 Datasheet PDF : 30 Pages
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NXP Semiconductors
NE1617A
Temperature monitor for microprocessor systems
Table 15. SMBus interface dynamic characteristics[1]
VDD = 3.0 V to 3.6 V; Tamb = 0 C to +125 C; unless otherwise specified.[2]
Symbol Parameter
Conditions
VIH
VIL
IOL
IIH
IIL
Ci
fSCLK
tLOW
tHIGH
tBUF
HIGH-level input voltage
LOW-level input voltage
logic output LOW sink current
HIGH-level input current
LOW-level input current
input capacitance
SCLK operating frequency
SCLK LOW time
SCLK HIGH time
bus free time between a STOP
and START condition
STBY, SCLK, SDATA
STBY, SCLK, SDATA
ALERT; VOL = 0.4 V
SDATA; VOL = 0.6 V
VI = VDD
VI = GND
SCLK, SDATA
from SDATA STOP
to SDATA START
tHD;STA
hold time (repeated) START
condition
from SDATA START to first SCLK
HIGH-to-LOW transition
tHD;DAT
data hold time
from SCLK HIGH-to-LOW transition
to SDATA edges
tSU;DAT
data set-up time
from SDATA edges
to SCLK LOW-to-HIGH transition
tSU;STA
set-up time for a repeated
START condition
from SCLK LOW-to-HIGH transition
to restart SDATA
tSU;STO
set-up time for STOP condition from SCLK LOW-to-HIGH transition
to SDATA STOP condition
tf
fall time
SCLK and SDATA signals
Min Typ Max
2.2
-
-
-
-
0.8
1.0
-
-
6.0
-
-
1
-
+1
1
-
+1
-
5
-
0
-
100
4.7
5.0
-
4.0
5.0
-
4.7
-
-
4.0
-
-
0
-
-
250 -
-
250 -
-
4.0
-
-
-
-
1.0
[1] The NE1617A does not include the SMBus time-out capability (tLOW;SEXT and tLOW;MEXT).
[2] Device operation between 3.0 V and 5.5 V is allowed, but parameters may be outside the limit shown in this table.
Unit
V
V
mA
mA
A
A
pF
kHz
s
s
s
s
ns
ns
ns
s
s
SCLK
SDATA
tBUF
P
S
tLOW
tr
tHD;STA
tHD;DAT
Fig 6. Timing measurements
tf
tHIGH
tSU;DAT
tSU;STA
tHD;STA
tSU;STO
S
P
002aae777
NE1617A
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 5 — 20 March 2012
© NXP B.V. 2012. All rights reserved.
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