HEF4081BT,653 View Datasheet(PDF) - NXP Semiconductors.
Part Name
Description
Manufacturer
HEF4081BT,653 Datasheet PDF : 11 Pages
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Nexperia
11. Waveforms
HEF4081B
Quad 2-input AND gate
9,
Q$Q%LQSXW
9
WU
90
W3/+
92+
Q<RXWSXW
92/
90
W7/+
WI
W3+/
W7+/
DDL
Fig 4.
Measurement points are given in Table 9.
Logic levels: VOL and VOH are typical output voltage levels that occur with the output load.
Input to output propagation delay and output transition times
Table 9. Measurement points
Supply voltage
VDD
5 V to 15 V
Input
VM
0.5VDD
Output
VM
0.5VDD
9''
9,
*
92
'87
57
&/
DDJ
Fig 5.
Test data is given in Table 10.
Definitions for test circuit:
DUT = Device Under Test.
CL = load capacitance including jig and probe capacitance.
RT = termination resistance should be equal to the output impedance Zo of the pulse generator.
Test circuit for measuring switching times
Table 10. Test data
Supply voltage
VDD
5 V to 15 V
Input
VI
VSS or VDD
tr, tf
20 ns
Load
CL
50 pF
HEF4081B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 8 — 15 December 2015
© Nexperia B.V. 2017. All rights reserved
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