ADM2485
TEST CIRCUITS
VOD
R
R
VOC
Figure 3. Driver Voltage Measurement
375Ω
VOD3 60Ω
VTST
375Ω
Figure 4. Driver Voltage Measurement
DDE OUT
RTS
150Ω
TxD
RxD
RE
VDD1
GND1
VDD2
195Ω
A
B
110Ω
VDD2 GND2
195Ω
GND2
Figure 5. Supply-Current Measurement Test Circuit
RTS
DDEE OUT
TxD
VCM(HF)
RxD
2.2kΩ
GND2
RECEIVE
ENABLE
VDD1
GND1 VDD2
VDD2
195Ω
B
A
110Ω 470nF
195Ω
GND2
GND2
50Ω
FTEST,
110nF VHF
50Ω
22kΩ
VTEST2
100nF
100nF
Figure 6. High Frequency Common-Mode Noise Test Circuit
Preliminary Technical Data
A
CL1
RLDIFF
B
CL2
Figure 7. Driver Propagation Delay
RTS
TxD
RxD
RE
VDD1
GND1
DE 150Ω
DE OUT 50pF
A
B
VDD2 GND2
Figure 8. RTS to DE OUT Propagation Delay
VCC
A
110Ω
TxD
S1
S2
B
50pF VOUT
RTS
Figure 9. Driver Enable/Disable
A
B RE
VOUT
CL
Figure 10. Receiver Propagation Delay
+1.5V
S1
–1.5V
RL
RE
CL
VOUT
VCC
S2
RE IN
Figure 11. Receiver Enable/Disable
Rev. PrK | Page 8 of 15