Electrical Characteristics
Sine Wave
Generator
0.01 µF
50 Ω
5.0 MΩ
Vin
OSCin
fR
MC145170-2
OSCout
Test Point
Sine Wave
Generator
VSS VDD
V+
V+
50 Ω
1.0 MΩ
0.01 µF
OSCin
fR Test Point
Vin
1.0 MΩ MC145170-2
OSCout
No Connect
VSS VDD
V+
Figure 9. Test Circuit, OSC Circuitry
Externally Driven [Note]
Figure 10. Circuit to Eliminate Self-Oscillation,
OSC Circuitry Externally Driven [Note]
NOTE
Use the circuit of Figure 10 to eliminate self-oscillation of the OSCin pin
when the MC145170-2 has power applied with no external signal applied
at Vin. (Self-oscillation is not harmful to the MC145170-2 and does not
damage the IC.)
OSCin
C1
MC145170-2
REFout
Test Point
OSCout
C2
VSS VDD
V+
REFout
1/f REFout
50%
Figure 11. Test Circuit, OSC Circuit with Crystal
Figure 12. Test Circuit
tw
90%
Output 50% 10%
tTHL
tTLH
Figure 13. Switching Waveform
Device
Under
Test
Test Point
Output
CL*
*Includes all probe and fixture capacitance.
Figure 14. Test Load Circuit
MC145170-2 Technical Data, Rev. 5
8
Freescale Semiconductor