MCP3001
Note: Unless otherwise indicated, VDD = VREF = 5V, fSAMPLE = 200 ksps, fCLK = 14*Sample Rate,TA = 25°C
0.4
0.3
Positive INL
0.2
0.1
0.0
-0.1
Negative INL
-0.2
-0.3
-0.4
-50
-25
0
25
50
Temperature (°C)
75
100
FIGURE 2-7: Integral Nonlinearity (INL) vs.
Temperature.
0.4
0.3 VDD = VREF = 2.7V
fSAMPLE = 75 ksps
0.2
Positive INL
0.1
0.0
-0.1
Negative INL
-0.2
-0.3
-0.4
-50
-25
0
25
50
75
100
Temperature (°C)
FIGURE 2-10: Integral Nonlinearity (INL) vs.
Temperature (VDD = 2.7V).
0.4
0.3
0.2
0.1
0.0
-0.1
-0.2
-0.3
-0.4
0
Positive DNL
Negative DNL
25 50 75 100 125 150 175 200 225 250
Sample Rate (ksps)
FIGURE 2-8: Differential Nonlinearity (DNL) vs.
Sample Rate.
1.0
0.8
0.6
0.4
Positive DNL
0.2
0.0
-0.2
-0.4
Negative DNL
-0.6
-0.8
-1.0
0
1
2
3
4
5
VREF (V)
FIGURE 2-9: Differential Nonlinearity (DNL) vs.
VREF.
0.4
0.3 VDD = VREF = 2.7V
0.2
Positive DNL
0.1
0.0
-0.1
Negative DNL
-0.2
-0.3
-0.4
0
25
50
75
100
Sample Rate (ksps)
FIGURE 2-11: Differential Nonlinearity (DNL) vs.
Sample Rate (VDD = 2.7V).
1.0
0.8
VDD = VREF = 2.7V
0.6
fSAMPLE = 75 ksps
0.4
Positive DNL
0.2
0.0
-0.2
Negative DNL
-0.4
-0.6
-0.8
-1.0
0.0
0.5
1.0
1.5
2.0
2.5
3.0
VREF(V)
FIGURE 2-12: Differential Nonlinearity (DNL) vs. VREF
(VDD = 2.7V).
© 2007 Microchip Technology Inc.
DS21293C-page 7