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FHP3132IS5X Ver la hoja de datos (PDF) - Fairchild Semiconductor

Número de pieza
componentes Descripción
Fabricante
FHP3132IS5X
Fairchild
Fairchild Semiconductor 
FHP3132IS5X Datasheet PDF : 16 Pages
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Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be operable
above the recommended operating conditions and stressing the parts to these levels is not recommended. In addition,
extended exposure to stresses above the recommended operating conditions may affect device reliability. The absolute
maximum ratings are stress ratings only.
Supply Voltage
Input Voltage Range
Parameter
Min.
0
-Vs -0.5V
Max.
12.6
+Vs +0.5V
Unit
V
V
Reliability Information
Parameter
Junction Temperature
Storage Temperature Range
Reow Temperature (Soldering)
Package Thermal Resistance
8-Lead SOIC(1)
5-Lead SOT23(1)
Min.
-65
Notes:
1. Package thermal resistance (θJA), JEDEC standard, multi-layer test boards, still air.
Typ.
155
296
ESD Protection
Product
Package
Human Body Model (HBM)
Charged Device Model (CDM)
FHP3132
SOT23
4.5kV
2kV
Max.
150
150
260
Unit
°C
°C
°C
°C/W
°C/W
FHP3232
SOIC
5kV
2kV
Recommended Operating Conditions
The Recommended Operating Conditions table denes the conditions for actual device operation. Recommended ope-
rating conditions are specied to ensure optimal performance to the datasheet specications. Fairchild does not recom-
mend exceeding them or designing to absolute maximum ratings.
Parameter
Operating Temperature Range
Supply Voltage Range
Min.
-40
2.7
Typ.
Max.
+85
12.0
Unit
°C
V
© 2007 Fairchild Semiconductor Corporation
3
FHP3132, FHP3232 Rev. 1.0.0
www.fairchildsemi.com

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