SGM4717YMS/TR Ver la hoja de datos (PDF) - Shengbang Microelectronics Co, Ltd
Número de pieza
componentes Descripción
Fabricante
SGM4717YMS/TR Datasheet PDF : 11 Pages
| |||
TEST CIRCUITS
10mA
V1
NO or NC
COM
VNO or VNC
RON = V1/10mA
Test Circuit 1. On Resistance
V+
0.1µF
V+
NO or NC
VNO or VNC
IN
COM
GND
RL
300Ω
VOUT
CL
35pF
VIN
VOUT
Test Circuit 2. Switching Times
50%
50%
90%
90%
tON
tOFF
V+
0.1µF
VNO or VNC
NC
NO
IN
V+
COM
RL
300Ω
VOUT
CL
35pF
GND
VIN 0
VNO or VNC
VOUT
50%
90%
tD
Test Circuit 3. Break-Before-Make Time Delay, tD
６
SGM4717
Share Link: 