WM8956
Preliminary Technical Data
Test Conditions
DCVDD = 1.8V, DBVDD = 3.3V, AVDD = SPKVDD1 = SPKVDD2 = 3.3V, TA = +25oC, 1kHz signal, fs = 48kHz, PGA gain =
0dB, 24-bit audio data unless otherwise stated.
PARAMETER
SYMBOL TEST CONDITIONS
MIN
TYP
MAX
UNIT
Headphone Outputs (HP_L, HP_R)
0dB Full scale output voltage
AVDD/3.3
Vrms
Mute attenuation
1kHz, full scale signal
86
dB
Channel Separation
L/RINPUT3 to headphone
110
dB
outputs via bypass
DAC to Line-Out (HP_L, HP_R, OUT3 with 10kΩ / 50pF load)
Signal to Noise Ratio
SNR
AVDD=3.3V
99
dB
(A-weighted)
AVDD=2.7V
98
Total Harmonic Distortion Plus
Noise
THD+N
AVDD=3.3V
AVDD=2.7V
-85
dB
-90
Total Harmonic Distortion
THD
AVDD=3.3V
-87
dB
AVDD=2.7V
-92
Channel Separation
1kHz full scale signal
110
dB
Headphone Output (HP_L, HP_R, using capacitors unless otherwise specified)
Output Power per channel
Total Harmonic Distortion +
Noise
PO
THD+N
Output power is very closely correlated with THD; see below.
AVDD=2.7V, RL=32Ω
-78
dB
PO=5mW
0.013
%
AVDD=2.7V, RL=16Ω
PO=5mW
-75
0.018
AVDD=3.3V, RL=32Ω,
PO=20mW
-72
0.025
AVDD=3.3V, RL=16Ω,
PO=20mW
-70
0.032
Signal to Noise Ratio
SNR
AVDD = 3.3V
92
99
dB
(A-weighted)
AVDD = 2.7V
98
Speaker Outputs (SPK_LP, SPK_LN, SPK_RP, SPK_RN with 8Ω bridge tied load)
Output Power
PO
Output power is very closely correlated with THD; see below
Total Harmonic Distortion + Noise THD+N PO =200mW, RL = 8Ω,
-78
dB
(DAC to speaker outputs)
SPKVDD1=SPKVDD2
0.013
%
=3.3V; AVDD=3.3V
PO =320mW, RL = 8Ω,
-72
dB
SPKVDD1=SPKVDD2
0.025
%
=3.3V; AVDD=3.3V
PO =500mW, RL = 8Ω,
-75
dB
SPKVDD1=SPKVDD2
0.018
%
=5V; AVDD=3.3V
PO =1W, RL = 8Ω,
-70
dB
SPKVDD1=SPKVDD2
0.032
%
=5V; AVDD=3.3V
Total Harmonic Distortion + Noise THD+N PO =200mW, RL = 8Ω,
-78
dB
(LINPUT3 and RINPUT3 to
SPKVDD1=SPKVDD2
0.013
%
speaker outputs)
=3.3V; AVDD=3.3V
PO =320mW, RL = 8Ω,
-72
dB
SPKVDD1=SPKVDD2
0.025
%
=3.3V; AVDD=3.3V
PO =500mW, RL = 8Ω,
-75
dB
SPKVDD1=SPKVDD2
0.018
%
=5V; AVDD=3.3V
PO =1W, RL = 8Ω,
-70
dB
SPKVDD1=SPKVDD2
0.032
%
=5V; AVDD=3.3V
w
PTD, July 2007, Rev 2.1
8