ZXMN2A02N8
ELECTRICAL CHARACTERISTICS (at Tamb = 25°C unless otherwise stated).
STATIC
PARAMETER
Drain-Source Breakdown Voltage
Zero Gate Voltage Drain Current
Gate-Body Leakage
Gate-Source Threshold Voltage
Static Drain-Source On-State
Resistance (1)
Forward Transconductance (1)(3)
DYNAMIC (3)
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
SWITCHING(2) (3)
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Gate Charge
Gate-Source Charge
Gate-Drain Charge
SOURCE-DRAIN DIODE
Diode Forward Voltage (1)
Reverse Recovery Time (3)
Reverse Recovery Charge (3)
SYMBOL MIN. TYP. MAX. UNIT
CONDITIONS.
V(BR)DSS 20
V ID=250μA, VGS=0V
IDSS
1
A VDS=20V, VGS=0V
IGSS
100 nA VGS=Ϯ12V, VDS=0V
VGS(th)
0.7
RDS(on)
0.02
V ID=250A, VDS= VGS
⍀ VGS=4.5V, ID=11A
0.04 ⍀ VGS=2.5V, ID=8.4A
gfs
27
S VDS=10V,ID=11A
Ciss
Coss
Crss
1900
356
218
pF
VDS=10V, VGS=0V,
pF f=1MHz
pF
td(on)
tr
td(off)
tf
Qg
Qgs
Qgd
7.9
10
33.3
13.6
18.9
5.2
4.9
ns
ns VDD =10V, ID=1A
ns RG≅6.0Ω, VGS=4.5V
ns
nC VDS=10V,VGS=4.5V,
nC ID=11A
nC
VSD
trr
Qrr
0.85
16.3
7.8
0.95
V TJ=25°C, IS=11.5A,
VGS=0V
ns TJ=25°C, IF=2.1A,
nC di/dt= 100A/μs
NOTES
(1) Measured under pulsed conditions. Width Յ300μs. Duty cycle Յ 2% .
(2) Switching characteristics are independent of operating junction temperature.
(3) For design aid only, not subject to production testing.
ISSUE 6 - FEBRUARY 2007
SEMICONDUCTORS
4