ZXMN10A08DN8
ELECTRICAL CHARACTERISTICS (at TA = 25°C unless otherwise stated).
PARAMETER
SYMBOL
STATIC
Drain-source breakdown voltage
Zero gate voltage drain current
Gate-body leakage
Gate-source threshold voltage
Static drain-source on-state resistance (1)
V(BR)DSS
IDSS
IGSS
VGS(th)
RDS(on)
Forward transconductance (1)(3)
DYNAMIC (3)
Input capacitance
Output capacitance
Reverse transfer capacitance
SWITCHING(2) (3)
Turn-on delay time
Rise time
Turn-off delay time
Fall time
Gate charge
gfs
Ciss
Coss
Crss
td(on)
tr
td(off)
tf
Qg
Total gate charge
Qg
Gate-source charge
Qgs
Gate-drain charge
Qgd
SOURCE-DRAIN DIODE
Diode forward voltage (1)
VSD
Reverse recovery time (3)
trr
Reverse recovery charge (3)
Qrr
MIN. TYP. MAX. UNIT CONDITIONS.
100
V ID=250A, VGS=0V
0.5 A VDS=100V, VGS=0V
100 nA VGS=Ϯ20V, VDS=0V
2.0
V
I
=25
D
0
A,
VDS=
VGS
0.25
0.30
⍀ VGS=10V, ID=3.2A
⍀ VGS=6V, ID=2.6A
5.0
S VDS=15V,ID=3.2A
405
28.2
14.2
pF
pF
VDS=50 V, VGS=0V,
f=1MHz
pF
3.4
ns
2.2
ns VDD =30V, ID=1.2A
8
ns RG≅6.0⍀, VGS=10V
3.2
ns
4.2
nC VDS=50V,VGS=5V,
ID=1.2A
7.7
nC
1.8
nC
VDS=50V,VGS=10V,
ID=1.2A
2.1
nC
0.87 0.95
27
32
V TJ=25°C, IS=3.2A,
VGS=0V
ns TJ=25°C, IF=1.2A,
nC di/dt= 100A/s
NOTES:
(1) Measured under pulsed conditions. Width = 300µs. Duty cycle ≤ 2% .
(2) Switching characteristics are independent of operating junction temperature.
(3) For design aid only, not subject to production testing.
ISSUE 4 - JANUARY 2005
SEMICONDUCTORS
4