MC74LVX125DTR2 Ver la hoja de datos (PDF) - ON Semiconductor
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MC74LVX125DTR2 Datasheet PDF : 6 Pages
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MC74LVX125
NOISE CHARACTERISTICS (Input tr = tf = 3.0ns, CL = 50pF, VCC = 3.3V, Measured in SOIC Package)
TA = 25°C
Symbol
Characteristic
Typ
Max
Unit
VOLP Quiet Output Maximum Dynamic VOL
0.3
0.5
V
VOLV Quiet Output Minimum Dynamic VOL
−0.3
−0.5
V
VIHD Minimum High Level Dynamic Input Voltage
2.0
V
VILD Maximum Low Level Dynamic Input Voltage
0.8
V
ORDERING INFORMATION
Device
Package
Shipping†
MC74LVX125D
SOIC−14
55 Units / Rail
MC74LVX125DG
SOIC−14
(Pb−Free)
55 Units / Rail
MC74LVX125DR2
SOIC−14
2500 Tape & Reel
MC74LVX125DR2G
SOIC−14
(Pb−Free)
2500 Tape & Reel
MC74LVX125DT
TSSOP−14*
96 Units / Rail
MC74LVX125DTR2
TSSOP−14*
2500 Tape & Reel
MC74LVX125M
SOEIAJ−14
2000 Tape & Reel
MC74LVX125MEL
SOEIAJ−14
2000 Tape & Reel
†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
*This package is inherently Pb−Free.
SWITCHING WAVEFORMS
D
50%
tPLH
O
50% VCC
Figure 3.
VCC
OE
GND
tPHL
O
O
TEST CIRCUITS
50%
tPZL
tPLZ
50% VCC
tPZH
tPHZ
50% VCC
Figure 4.
VCC
GND
HIGH
IMPEDANCE
VOL +0.3V
VOH −0.3V
HIGH
IMPEDANCE
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
CL*
DEVICE
UNDER
TEST
TEST POINT
OUTPUT
1 kW
CL*
CONNECT TO VCC WHEN
TESTING tPLZ AND tPZL.
CONNECT TO GND WHEN
TESTING tPHZ AND tPZH.
*Includes all probe and jig capacitance
Figure 5. Propagation Delay Test Circuit
*Includes all probe and jig capacitance
Figure 6. Three−State Test Circuit
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