AD5220 Ver la hoja de datos (PDF) - Analog Devices

Número de pieza

componentes Descripción

Fabricante

AD5220

Increment/Decrement Digital Potentiometer

Analog Devices 

Parametric Test Circuits–AD5220

DUT

A

V+

W

B

V+ = VDD

1LSB = V+/128

VMS

OFFSET

GND

A DUT B

~ VIN

+5V

W

OP279

2.5V DC

VOUT

Figure 27. Potentiometer Divider Nonlinearity Error Test

Circuit (INL, DNL)

Figure 31. Inverting Programmable Gain Test Circuit

NO CONNECT

DUT

A

W

B

IW

VMS

OFFSET

GND

~ VIN

W

+5V

OP279

A DUT B

2.5V

VOUT

Figure 28. Resistor Position Nonlinearity Error (Rheostat

Operation; R-INL, R-DNL)

Figure 32. Noninverting Programmable Gain Test Circuit

VMS2

DUT

A

W

B

IW = VDD/RNOMINAL

VW

VMS1

RW = [VMS1 – VMS2]/IW

␣␣

Figure 29.␣ Wiper Resistance Test Circuit

A

~ VIN

DUT

W

OFFSET

GND

B

2.5V

+15V

OP42

VOUT

–15V

Figure 33. Gain vs. Frequency Test Circuit

VA

~ VDD

V+

A

W

B

V+ = VDD ± 10%

( ) ⌬VMS

PSRR (dB) = 20 LOG –––––

⌬VDD

VMS

PSS (%/%) = –⌬–V–M––S–%–

⌬VDD%

Figure 30. Power Supply Sensitivity Test Circuit (PSS,

PSRR)

DUT

W

B

RSW

=

0.1V

ISW

CODE = ØØH

ISW

0.1V

0 TO VDD

Figure 34. Incremental ON Resistance Test Circuit

REV. A

–7–

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