Test Circuit
LA2000M
Unit (resistance: Ω, capacitance: F)
Test Conditions
Test items
Circuit current
Symbol
ICC
Output transistor saturation voltage
Output diode forward voltage
Output-off level in input equivalent
VCE (sat)
VF
VIN
Comparator-on level
Comparator-off level
Pin 7 high level
Output transistor leakage current
Output diode leakage current
VH
VL
Vp-7
ITL
IDL
Sample Application Circuit 1
SW-1
1
2
2
1
2
2
2
2
2
SW-2
1
2
4
1
3
3
4
4
4
SW-3
1
2
2
1
1
1
1
3
4
SW-4
3
3
1
3
3
3
3
3
2
Conditions
Measure current flowing into pin 8 at
VIN = −45 dB
Measure VIN at pin 5
Measure VIN at pin 5
Input level (v.v) when pin 5 turns
over
Measure V3 when pin 5 turns over
Measure V3 when pin 5 turns over
Measure V2 at pin 7
Measure M3
Measure M2
Mechanism-coupled switch
(OFF at play mode)
Plunger
Unit (resistance: Ω, capacitance: F)
No.4158-3/7