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CXP81960 Ver la hoja de datos (PDF) - Sony Semiconductor

Número de pieza
componentes Descripción
Fabricante
CXP81960
Sony
Sony Semiconductor 
CXP81960 Datasheet PDF : 27 Pages
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CXP81952/81960
AC Characteristics
(1) Clock timing
(Ta = –20 to +75°C, VDD = 3.0 to 5.5V, Vss = 0V)
Item
Symbol Pins
Conditions
Min. Max. Unit
System clock frequency fC
System clock input
tXL,
pulse width
tXH
System clock input
tCR,
rise and fall times
tCF
Event count clock input tEH,
pulse width
tEL
Event count clock input tER,
rise and fall times
tEF
XTAL
EXTAL
XTAL
EXTAL
Fig. 1,
VDD = 4.5 to 5.5V
Fig. 2
Fig. 1,
VDD = 4.5 to 5.5V
Fig. 2 (External clock drive)
1
1
28
37.5
XTAL Fig. 1, Fig. 2
EXTAL (External clock drive)
16 MHz
12
ns
200 ns
EC
Fig. 3
tsys × 4
ns
EC
Fig. 3
20 ns
System clock frequency fC
TEX Fig. 2 VDD = 2.7 to 5.5V
TX
(32kHz clock applied condition)
32.768
kHz
Event count clock input tTL,
pulse width
tTH
TEX Fig. 3
10
µs
Event count clock input tTR,
rise and fall times
tTF
TEX
Fig. 3
20 ms
tsys indicates three values according to the contents of the clock control register (address; 00FEH) upper 2
bits (CPU clock selection).
tsys [ns] = 2000/fc (Upper 2 bits = "00"), 4000/fc (Upper 2 bits = "01"), 16000/fc (Upper 2 bits = "11")
Fig. 1. Clock timing
1/fc
EXTAL
VDD – 0.4V
0.4V
Fig. 2. Clock applied condition
Crystal oscillation
Ceramic oscillation
tXH
tCF
External clock
tXL
tCR
32kHz clock applied condition
crystal oscillation
EXTAL XTAL
C1
C2
EXTAL XTAL
74HC04
TEX
C1
TX
C2
Fig. 3. Event count clock timing
TEX
EC
tEH
tTH
tEF
tEL
tTF
tTL
– 17 –
0.8VDD
0.2VDD
tER
tTR

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