AN2064 Ver la hoja de datos (PDF) - STMicroelectronics

Número de pieza

componentes Descripción

Fabricante

AN2064

Compliance of series/parallel protections for Telecom CO

STMicroelectronics 

AN2064 - APPLICATION NOTE

Figure 11 shows the measurement circuit used for this test series. During lightning and mains contact

tests, the surge current (I surge) injected in Tip L or Ring L (transversal tests) or both Tip L and Ring L

(longitudinal tests) has been measured. The remaining voltages at Tip S or Ring S have been also

measured (V).

Figure 11: Measurement circuit

Surge

Generator

I surge

Line side

DUT

Protected device side

V

Oscilloscope

Current probe

Voltage probe

The curves of the figures 12, 13 and 14 show the results, respectively, of :

- a case of lightning test

- a case of first level AC power fault test

- a case of second level AC power fault test.

These curves show no impact of both fuses and TRISIL during first level tests while the fuses open safely

during certain second level tests.

Figure 12: Module behavior during 2/10µs 500A surge test

I surge (100A/div)

V (50V/div)

11/14

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