WM8731
Advanced Information
ABSOLUTE MAXIMUM RATINGS
Absolute Maximum Ratings are stress ratings only. Permanent damage to the device may be caused by continuously operating at
or beyond these limits. Device functional operating limits and guaranteed performance specifications are given under Electrical
Characteristics at the test conditions specified
ESD Sensitive Device. This device is manufactured on a CMOS process. It is therefore generically susceptible
to damage from excessive static voltages. Proper ESD precautions must be taken during handling and storage
of this device.
CONDITION
MIN
MAX
Digital supply voltage
-0.3V
+3.63V
Analogue supply voltage
-0.3V
+3.63V
Voltage range digital inputs
DGND -0.3V
DVDD +0.3V
Voltage range analogue inputs
AGND -0.3V
AVDD +0.3V
Master Clock Frequency (see Note 4)
40MHz
Operating temperature range, TA
Storage temperature
-10°C
-65°C
+70°C
+150°C
Package body temperature (soldering 10 seconds)
+240°C
Package body temperature (soldering 2 minutes)
+183°C
Notes:
1. Analogue and digital grounds must always be within 0.3V of each other.
2. The digital supply core voltage (DCVDD) must always be less than or equal to the analogue supply voltage (AVDD) or
digital supply buffer voltage (DBVDD).
3. The digital supply buffer voltage (DBVDD) must always be less than or equal to the analogue supply voltage (AVDD).
4. When CLKIDIV2=1
RECOMMENDED OPERATING CONDITIONS
PARAMETER
SYMBOL
TEST
MIN
CONDITIONS
Digital supply range (Core)
DCVDD
1.42
Digital supply range (Buffer)
DBVDD
2.7
Analogue supply range
AVDD, HPVDD
2.7
Ground
DGND,AGND,HPGND
Total analogue supply current
IAVDD, IHPVDD
DCVDD, DBVDD,
AVDD,
HPVDD= 3.3V
Digital supply current
IDCVDD, IDBVDD
DCVDD, DBVDD,
AVDD,
HPVDD= 3.3V
Standby Current Consumption
TYP
MAX
UNIT
3.6
V
3.6
V
3.6
V
0
V
13
mA
3
mA
10
uA
WOLFSON MICROELECTRONICS LTD
AI Rev 2.0 February 2001
7