SPT5510 データシートの表示（PDF） - Signal Processing Technologies
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SPT5510 Datasheet PDF : 8 Pages
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ELECTRICAL SPECIFICATIONS
TA= 25 °C, VEE=–5.2 V ±5%, 50% duty cycle clock, unless otherwise specified.
TEST
TEST
PARAMETERS
CONDITIONS
LEVEL
Power Supply Requirements
Negative Supply Current (–5.2 V) TMIN –TMAX
VI
Nominal Power Dissipation
V
Power Supply Rejection Ratio
∆V Supply = ±5 %
I
Voltage Input and Control
Bandgap Reference Voltage
V
Bandgap Output Current
TA=25 °C ±10 °C
IV
Ref Amp Bandwidth3
V
Ref Amp Input Current
V
Ref Amp Output Current
V
Ref In Operating Voltage
V
Digital Inputs
Logic 1 Voltage
TMIN –TMAX
VI
Logic 0 Voltage
TMIN –TMAX
VI
Logic 1 Current
–0.8 V
V
Logic 0 Current
–1.8 V
V
Input Capacitance
V
Input Setup Time (tS)
IV
Input Hold Time (tH)
IV
Clock Pulse Width (tPWH)
IV
3Ref Amp Bandwidth is limited by its compensation network
MIN
–0.6
–110
–1.0
3.0
0.5
1.5
SPT5510
TYP
115
600
±0.002
–1.2
16
40
16
200
–3.4
–0.8
–1.7
2.5
0
3
MAX UNITS
150
mA
800
mW
0.6
% FS
V
220
µA
MHz
µA
µA
V
V
–1.5
V
µA
µA
pF
ns
ns
ns
TEST LEVEL CODES
TEST LEVEL
All electrical characteristics are subject
I
to the following conditions:
II
All parameters having min/max specifi-
cations are guaranteed. The Test Level
III
column indicates the specific device
testing actually performed during pro-
IV
duction and Quality Assurance inspec-
tion. Any blank section in the data
V
column indicates that the specification
is not tested at the specified condition.
VI
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at TA = +25 °C, and sample tested at the specified
temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and characterization
data.
Parameter is a typical value for information purposes only.
100% production tested at TA = +25 °C. Parameter is guaranteed over
specified temperature range.
SPT
3
SPT5510
9/27/00
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