NXP Semiconductors
74LVC1G38
2-input NAND gate; open drain
14. Abbreviations
Table 11. Abbreviations
Acronym
Description
CMOS
Complementary Metal Oxide Semiconductor
DUT
Device Under Test
ESD
ElectroStatic Discharge
HBM
Human Body Model
MM
Machine Model
TTL
Transistor-Transistor Logic
15. Revision history
Table 12. Revision history
Document ID Release date
Data sheet status
Change notice
Supersedes
74LVC1G38_3
Modifications:
20070827
Product data sheet
-
74LVC1G38_2
• The format of this data sheet has been redesigned to comply with the new identity guidelines of NXP
Semiconductors.
• Legal texts have been adapted to the new company name where appropriate.
• In Section 10 “Static characteristics”, changed conditions for input leakage and supply current.
• Figure 12 “Package outline SOT891 (XSON6)” updated.
74LVC1G38_2 20060913
Product data sheet
-
74LVC1G38_1
74LVC1G38_1 20041018
Product data sheet
-
-
74LVC1G38_3
Product data sheet
Rev. 03 — 27 August 2007
© NXP B.V. 2007. All rights reserved.
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