ADM1031
Table 4. ELECTRICAL CHARACTERISTICS (TA = TMIN to TMAX, VCC = VMIN to VMAX, unless otherwise noted.) (Note 1)
Parameter
Test Conditions/Comments
Min
Typ
Max
OPEN-DRAIN SERIAL DATA BUS OUTPUT (SDA)
Output Low Voltage, VOL
High-Level Output Leakage Current, IOH
SERIAL BUS DIGITAL INPUTS (SCL, SDA)
IOUT = –6.0 mA; VCC = 3.0 V
VOUT = VCC
−
−
0.4
−
0.1
1.0
Input High Voltage, VIH
Input Low Voltage, VIL
Hysteresis
2.1
−
−
−
−
0.8
−
500
−
DIGITAL INPUT LOGIC LEVELS (ADD, THERM, TACH1/2) (Note 2)
Input High Voltage, VIH
Input Low Voltage, VIL
DIGITAL INPUT LEAKAGE CURRENT
2.1
−
−
−
−
0.8
Input High Current, IIH
Input Low Current, IIL
Input Capacitance, CIN
FAN RPM-TO-DIGITAL CONVERTER
Accuracy
Full-Scale Count
VIN = VCC
VIN = 0
60C TA 100C
–1.0
−
−
−
−
1.0
−
5.0
−
−
−
6.0
−
−
255
TACH Nominal Input RPM
Divisor N = 1, Fan Count = 153
Divisor N = 2, Fan Count = 153
Divisor N = 4, Fan Count = 153
Divisor N = 8, Fan Count = 153
−
4400
−
−
2200
−
−
1100
−
−
550
−
Conversion Cycle Time
−
637
−
SERIAL BUS TIMING (Note 3)
Clock Frequency, fSCLK
See Figure 2 for All Parameters
10
−
100
Glitch Immunity, tSW
−
50
−
Bus Free Time, tBUF
4.7
−
−
Start Setup Time, tSU;STA
4.7
−
−
Start Hold Time, tHD;STA
4.0
−
−
Stop Condition Setup Time, tSU;STO
4.0
−
−
SCL Low Time, tLOW
1.3
−
−
SCL High Time, tHIGH
4.0
−
50
SCL, SDA Rise Time, tR
−
−
1000
SCL, SDA Fall Time, tF
−
−
300
Data Setup Time, tSU;DAT
250
−
−
Data Hold Time, tHD;DAT
300
−
−
1. Typicals are at TA = 25C and represent most likely parametric norm. Shutdown current typ is measured with VCC = 3.3 V.
2. ADD is a three-state input that can be pulled high, low, or left open-circuit.
3. Timing specifications are tested at logic levels of VIL = 0.8 V for a falling edge and VIH = 2.2 V for a rising edge.
Unit
V
mA
V
V
mV
V
V
mA
mA
pF
%
RPM
ms
kHz
ns
ms
ms
ms
ms
ms
ms
ns
ns
ns
ns
SCL
t LOW
tR
tHD; STA
tHD; DAT
tF
tHIGH
tSU; DAT
t HD; STA
tSU; STA
tSU; STO
SDA
tBUF
P
S
S
P
Figure 2. Serial Bus Timing Diagram
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