EL2257C/EL2357C
125 MHz Single Supply, Clamping Op Amps
Closed Loop AC Electrical Characteristics
VunSl=e+ss5Vot,hGerNwDis=e0sVp,eTciAfi=e2d5[°1C] , VCM=+1.5V, VOUT=+1.5V, VCLAMP=+5V, VENABLE=+5V, AV=+1, RF=0Ω, RL=150Ω to GND pin,
Parameter
Description
BW
-3 dB Bandwidth (Vout=400 mVp-p)
BW
±0.1 dB Bandwidth (Vout=400 mVp-p)
GBWP
PM
SR
tR,tF
OS
tPD
tS
dG
dP
eN
iN
tDIS
tEN
tCL
Gain Bandwidth Product
Phase Margin
Slew Rate
Rise Time, Fall Time
Overshoot
Propagation Delay
0.1% Settling Time
0.01% Settling Time
Differential Gain [2]
Differential Phase [2]
Input Noise Voltage
Input Noise Current
Disable Time [3]
Enable Time [3]
Clamp Overload Recovery
Test Conditions
Min Typ
VS=+5V, AV=+1, RF=0Ω
VS=+5V, AV=-1, RF=500Ω
VS=+5V, AV=+2, RF=500Ω
VS=+5V, AV=+10, RF=500Ω
VS=+12V, AV=+1, RF=0Ω
VS=+3V, AV=+1, RF=0Ω
VS=+12V, AV=+1, RF=0Ω
VS=+5V, AV=+1, RF=0Ω
VS=+3V, AV=+1, RF=0Ω
VS=+12V, @ AV=+10
RL=1 kΩ, CL=6 pF
VS=+10V, RL=150Ω, Vout=0V to +6V
VS=+5V, RL=150Ω, Vout=0V to +3V
±0.1V Step
125
60
60
6
150
100
25
30
20
60
55
200
275
300
2.8
±0.1V Step
10
±0.1V step
3.2
VS=±5V, RL=500Ω, AV=+1, VOUT=±3V
40
VS=±5V, RL=500Ω, AV=+1, VOUT=±3V
75
AV=+2, RF=1 kΩ
0.05
AV=+2, RF=1 kΩ
0.05
f=10 kHz
48
f=10 kHz
1.25
50
25
7
Test
Max Level Units
V
MHz
V
MHz
V
MHz
V
MHz
V
MHz
V
MHz
V
MHz
V
MHz
V
MHz
V
MHz
V
°
I
V/µs
V
V/µs
V
ns
V
%
V
ns
V
ns
V
ns
V
%
V
°
V nV/ÐH
z
V pA/ÐH
z
V
ns
V
ns
V
ns
1. All AC tests are performed on a “warmed up” part, except slew rate, which is pulse tested.
2. Standard NTSC signal = 286 mVp-p, f=3.58 MHz, as VIN is swept from 0.6V to 1.314V. RL is DC coupled.
3. Disable/Enable time is defined as the time from when the logic signal is applied to the ENABLE pin to when the supply current has reached half its
final value.
4