5962-9161706QZC(2007) データシートの表示（PDF） - Atmel Corporation

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5962-9161706QZC
(Rev.:2007)

Rad. Tolerant High Speed 8 Kb x 16 Dual Port RAM

Atmel Corporation 

AC Parameters

AC Test Conditions

Input Pulse Levels: GND to 3.0V

Input Rise/Fall Times: 5 ns

Input Timing Reference Levels: 1.5V

M67025E

Output Reference Levels: 1.5V

Output Load: See Figures 2, 3

Figure 2. Output Load

Figure 3. Output Load (for tHZ, tLZ, tWZ, and tOW)

1(1)

(11)

Note: 1. Including scope and jig.

AC Read Characteristics

Table 7. Over the Full Operating Temperature and Supply Voltage Range

Read Cycle

Symbol(4)

Symbol(5)

TAVAVR

tRC

TAVQV

tAA

TELQV

tACS

TBLQV

tABE

TGLQV

tAOE

TAVQX

tOH

TELQX

tLZ

TEHQZ

tHZ

TPU

tPU

TPD

tPD

TSOP

tSOP

TSLQV

tACS

Parameter

Read cycle time

Address access time

Chip Select access time(3)

Byte enable access time(3)

Output enable access time

Output hold from address change

Output low Z time (1) (2)

Output high Z time (1) (2)

Chip Select to power up time (2)

Chip disable to power down time (2)

SEM flag update pulse (OE or SEM)

Semaphore Access time(3)

M

67025-30

M

67025-45

Min. Max. Min. Max. Unit

30

–

45

–

ns

–

30

–

45

ns

–

30

–

45

ns

–

30

–

45

ns

–

15

–

25

ns

3

–

3

–

ns

3

–

5

–

ns

–

15

–

20

ns

0

–

0

–

ns

–

50

–

50

ns

15

–

15

–

ns

–

30

–

45

ns

Notes:

1. Transition is measured +500 mV from low or high impedance voltage with load (Figure 2 and Figure 3).

2. This parameter is guaranteed but not tested.

3. To access RAM CS = VIL, UB or LB = VIL, SEM = VIH. To access semaphore CS = VIH, SEM = VIL. Refer to Table 1.

4. STD symbol.

5. ALT symbol.

13

4146N–AERO–04/07

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