CXD1178Q データシートの表示（PDF） - Sony Semiconductor
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CXD1178Q Datasheet PDF : 15 Pages
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CXD1178Q
(fCLK=40 MHz, AVDD=DVDD=5 V, ROUT=200 Ω, VREF=2.0 V, Ta=25 °C)
Item
Symbol Measurement conditions
Resolution
n
Conversion speed
AVDD=DVDD=4.75 to 5.25 V
fCLK
Ta=–40 to 85 °C
Integral non-linearity error EL
Differential non-linearity error ED
Endpoint
Output full-scale voltage
VFS
Output full-scale ratio ∗1
FSR
Output full-scale current
IFS
Output offset voltage
VOS When “00000000” data input
Glitch energy
GE
ROUT=75 Ω
Crosstalk
CT
When 1 MHz sine wave input
Supply current
IDD
14.3MHz color bar CE= “L”
ISTB data input
CE= “H”
Analog input resistance
RIN
VREF
Input capacitance
CI
Digital input voltage
VIH
AVDD=DVDD=4.75 to 5.25 V
VIL
Ta=–20 to 75 °C
Digital input current
IIH
AVDD=DVDD=4.75 to 5.25 V
IIL
Ta=–20 to 75 °C
Setup time
ts
ROUT=75 Ω
Hold time
th
ROUT=75 Ω
Propagation delay time
CE enable time ∗2
CE disable time ∗2
tPD
tE
CE= H→L
tD
CE= L→H
Min.
0.5
–2.5
–0.3
1.8
0
1
2.4
–5
5
10
Typ.
8
2.0
1.5
10
30
57
42
1
10
1.8
1.8
Max. Unit
bit
40 MSPS
2.5 LSB
0.3 LSB
2.2
V
3.0
%
15
mA
1
mV
pV•s
dB
48
mA
2
MΩ
9
pF
V
0.8
5
µA
ns
ns
ns
4
ms
4
ms
∗1 Full-scale output ratio =
Full-scale voltage of channel
–1 × 100 (%)
Average of the full-scale voltage of the channels
∗2 When the external capacitor for the VG pin is 0.1 µF.
—6—
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