SI534 データシートの表示（PDF） - Silicon Laboratories
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SI534
Silicon Laboratories
SI534 Datasheet PDF : 2 Pages
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Process Change Notice #1106071
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Appendix A:
Si530/31 datasheet revision 1.1 to v1.2 changes:
Updated 2.5 V/3.3 V and 1.8 V CML output level specifications for Table 3 on page 3.
Added footnotes clarifying max offset frequency test conditions for Table 4 on page 4.
Added CMOS phase jitter specs to Table 4 on page 4.
Removed the words "Differential Modes: LVPECL/LVDS/CML" in footnote referring to AN256 in Table 4 on page 4.
Separated 1.8 V, 2.5 V/3.3 V supply voltage specifications in Table 8 on page 5.
Updated and clarified Table 8 on page 5 to include the "Moisture Sensitivity Level" and "Contact Pads" rows.
Updated Figure 3 on page 9 and Table 12 on page 9 to reflect specific marking information. Previously, Figure 3
was generic.
Si532 datasheet revision 1.1 to v1.2 changes:
Updated 2.5 V/3.3 V and 1.8 V CML output level specifications for Table 3 on page 3.
Added footnotes clarifying max offset frequency test conditions for Table 4 on page 4.
Removed the words "Differential Modes: LVPECL/LVDS/CML" in footnote referring to AN256 in Table 4 on page 4.
Added CMOS phase jitter specs to Table 4 on page 4.
Updated Table 8 on page 5 to include the "Moisture Sensitivity Level" and "Contact Pads" rows.
Updated Figure 3 and Table 11 on page 9 to reflect specific marking information. Previously, Figure 3 was generic.
Si533 datasheet revision 1.1 to v1.2 changes:
Updated 2.5 V/3.3 V and 1.8 V CML output level specifications for Table 3 on page 3.
Added footnotes clarifying max offset frequency test conditions for Table 4 on page 4.
Removed the words "Differential Modes: LVPECL/LVDS/CML" in footnote referring to AN256 in Table 4 on page 4.
Added CMOS phase jitter specs to Table 4 on page 4.
Updated Table 8 on page 5 to include the "Moisture Sensitivity Level" and "Contact Pads" rows.
Updated Figure 3 and Table 10 on page 9 to reflect specific marking information. Previously, Figure 3 was generic.
Updated contact information on page 12.
Si533 datasheet revision 1.1 to v1.2 changes:
Updated 2.5 V/3.3 V and 1.8 V CML output level specifications for Table 3 on page 3.
Added footnotes clarifying max offset frequency test conditions for Table 4 on page 4.
Removed the words "Differential Modes: LVPECL/LVDS/CML" in footnote referring to AN256 in Table 4 on page 4.
Added CMOS phase jitter specs to Table 4 on page 4.
Updated ESD HBM sensitivity rating in Table 7 on page 5.
Updated Table 8 on page 5 to include the "Moisture Sensitivity Level" and "Contact Pads" rows.
Updated package diagram to include crystal impedance pin in Figure 2 on page 8.
Updated Figure 3 and Table 11 on page 9 to reflect specific marking information. Previously, Figure 3 was generic.
Access to online datasheets:
Si530/31 Datasheet v1.2 can be found here:
http://www.silabs.com/Support%20Documents/TechnicalDocs/si530.pdf
Si532 Datasheet v1.2 can be found here:
http://www.silabs.com/Support%20Documents/TechnicalDocs/si532.pdf
Si533 Datasheet v1.2 can be found here:
http://www.silabs.com/Support%20Documents/TechnicalDocs/si533.pdf
Si534 Datasheet v1.2 can be found here:
http://www.silabs.com/Support%20Documents/TechnicalDocs/si534.pdf
W7206F1 Process Change Notice Form rev AA
The information contained in this document is PROPRIETARY to Silicon Laboratories, Inc. and shall not be reproduced or used in
part or whole without Silicon Laboratories’ written consent. The document is uncontrolled if printed or electronically saved. Pg 2
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