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Website: http: //www.microsemi.com
TECHNICAL DATA SHEET
1 Amp SOLID STATE RELAYS
Table 4 – RELIABILITY SCREENING OPTIONS
Element Evaluation
Non-Destruct Wirebond Pull
Pre-Cap Visual
Temperature Cycle
Constant Acceleration
PIND
Pre-Burn In Electrical
Burn In
Final Electrical Tests
Hermeticity (Fine and Gross Leak)
X-Ray
External Visual
Certified
C
COTS
N/A
N/A
N/A
N/A
N/A
N/A
N/A
N/A
100% (25C)
100%
N/A
Sample
N/A
H
K
EQUIVALENT
MIL-PRF-38534 (Note 3)
Class H
Class K
Sample
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%
100%
(160 hours) (320 hours)
100%
100%
100%
100%
N/A
100%
100%
100%
Yes
Yes
MIL-STD-883
METHOD
2023
2017
1010
2001
2020
1015
1014
2012
2009
NOTE:
(1) Internal switch is rated for > 1000 Volts breakdown. Consult factory for use at Voltages greater than 250
Volts.
(2) Current handling capability depends upon allowable Tcase and allowable Tj. See Figure 1.
(3) Microsemi does not at this time have a MIL-PRF-38534 qualified radiation hardness assurance program.
(4) Guaranteed by design.
(5) Because of the relatively slow switching times involved in power SSRs, it is important to stay within the
allowances of the performance curves.
T4-LDS-0153 Rev. 2 (110368)
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