BYT230Y-400
Fig. 7: Junction capacitance versus reverse
voltage applied (typical values, per diode).
Fig. 8: Recoverycharges versus dIF/dt (per diode).
C(pF)
100
50
20
10
1
VR(V)
10
F=1MHz
Tj=25°C
Qrr(nC)
1000
IF=IF(av)
90% confidence
Tj=100°C
100
100 200
10
10
20
dIF/dt(A/µs)
50
100
200
500
Fig. 9: Recovery current versus dIF/dt (per diode).
Fig. 10: Transient peak forward versus dIF/dt (per
diode).
IRM(A)
50
IF=IF(av)
90% confidence
Tj=100°C
10
1
10
20
dIF/dt(A/µs)
50
100
200
VFP(V)
30
IF=IF(av)
90% confidence
25
Tj=100°C
20
15
10
5
0
500
0
dIF/dt(A/µs)
100
200
300
400
500
Fig. 11: Forward recovery time versus dIF/dt (per
diode).
Fig. 12: Dynamic parameters versus junction
temperature.
tfr(µs)
1.50
1.25
1.00
0.75
0.50
0.25
0.00
0
100
dIF/dt(A/µs)
200
300
IF=IF(av)
90% confidence
Tj=100°C
400
500
Qrr;IRM[Tj] / Qrr;IRM[Tj=100°C]
1.50
1.25
1.00
0.75
IRM
0.50
0.25
0
Qrr
Tj(°C)
25
50
75
100 125 150
4/5