MAT01 データシートの表示（PDF） - Analog Devices

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MAT01

Matched Monolithic Dual Transistor

Analog Devices 

MAT01

TEST CIRCUITS

+16.5V

+16.5V

50kΩ*

50kΩ*

50kΩ*

20kΩ

S1A

1MΩ

100pF

OP1177

MAT01

–15V

S1B

1MΩ*

20µA

100pF

VOUT

100kΩ

1%

TEST S1A

S1B

UNITS

VOS CLOSED CLOSED

VOUT1

1V PER mV

IOS OPEN OPEN VOUT2 – VOUT1 1V PER nA

100kΩ

1%

V–

*MATCHED TO 0.01%

Figure 11. Matching Measurement Circuit

+15V

50kΩ*

50kΩ*

50kΩ*

+15V

S1A

4MΩ

2pF

MAT01

720kΩ 20µA

S1B –15V

4MΩ

2pF

S3 B

S2

A

2.5MΩ

4kΩ

100Ω

SPECTRUM

ANALYZER

OR

QUAN-TECH

IC NOISE

ANALYZER

2181/2283

V01

NOISE

DENSITY

3.3kΩ

V02

LOW

FREQUENCY

NOISE

4.7µF

–15V

*MATCHED TO 0.01%

TEST

S1A

S1B

S2 S3**

READING

NOISE VOLTAGE DENSITY CLOSED CLOSED CLOSED A

(PER TRANSISTOR)

V01/√2

NOISE CURRENT DENSITY OPEN

(PER TRANSISTOR)

OPEN CLOSED A

V01/(√2 × 4MΩ)

LOW FREQUENCY NOISE CLOSED CLOSED OPEN

(REFERRED TO INPUT)

B V02 PEAK-TO-PEAK

25,000

**A AND B REFER TO THE THROW POSITION OF THE SWITCH

Figure 12. Noise Measurement Circuit

Data Sheet

Rev. C | Page 8 of 12

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