C3225X5R1C226M データシートの表示（PDF） - Orister Corporation

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C3225X5R1C226M

2A, 20V, 400KHz DC/DC Asynchronous Step‐Down Converter

Orister Corporation 

Page No. : 4/10

Electrical Characteristics (VIN=12V, TA=25°C, unless otherwise specified)

Symbol

Parameter

Conditions

Min. Typ. Max. Unit

VIN

VFB

RDS(ON)1

RDS(ON)2

ISw

ILIM

GCS

AVEA

GEA

FS

FOSC1

DMAX

tON

‐

‐

‐

‐

Input Voltage

Feedback Voltage

Upper Switch On Resistance

Lower Switch On Resistance

Upper Switch Leakage

Current Limit (NOTE 1)

Current Sense Transconductance Output

Current to Comp Pin Voltage

Error Amplifier Voltage Gain

Error Amplifier Transconductance

Oscillator Frequency

Short Circuit Frequency

Maximum Duty Cycle

Minimum On Time

EN Shutdown Threshold

Enable Pull Up Current

EN UVLO Threshold Rising

EN UVLO Threshold Hysteresis

‐

4.75V ≤ VIN ≤ 20V

‐

‐

VEN = 0V, VSW = 0V

‐

‐

‐

‐

‐

VFB = 0V

VFB = 1.0V

‐

ICC＞100uA

VEN = 0V

VIN Rising

‐

4.75 ‐

20

V

1.19 1.23 1.26 V

‐ 0.22 ‐

Ω

‐

10

‐

Ω

‐

‐

10 uA

‐

3.8

‐

A

‐ 1.95 ‐ A/V

‐ 400 ‐ V/V

550 830 1150 uA/V

‐ 400 ‐ KHz

‐ 240 ‐ KHz

‐

90

‐

%

‐ 100 ‐

ns

0.7 1.0 1.3 V

‐

1.0

‐

uA

2.35 2.50 2.65 V

‐

200

‐

mV

ISD

Supply Current (Shutdown)

IQ

Supply Current (Quiescent)

TSD

Thermal Shutdown

VIN ≤0.4V

VEN ≥3V

‐

‐

23 36 uA

‐

1.1 1.3 mA

‐ 160 ‐

oC

Notes:

1. Slope compensation changes current limit above 40% duty cycle.

2. Stresses listed as the above "Absolute Maximum Ratings" may cause permanent damage to the device. These are for

stress ratings. Functional operation of the device at these or any other conditions beyond those indicated in the

operational sections of the specifications is not implied. Exposure to absolute maximum rating conditions for extended

periods may remain possibility to affect device reliability.

3. Devices are ESD sensitive. Handling precaution is recommended.

4. The device is not guaranteed to function outside its operating conditions.

5. θJA is measured in the natural convection at TA = 25°C on a high effective four layers thermal conductivity test board of

JEDEC 51‐7 thermal measurement standard.

DS‐RS6516‐05 February, 2010

www.Orister.com

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