81N17L-J-T92-E-B 데이터 시트보기 (PDF) - Unisonic Technologies

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81N17L-J-T92-E-B

VOLTAGE DETECTORS WITH BUILT-IN DELAY TIME

Unisonic Technologies 

81CXXX/81NXXX

TEST CIRCUITS

1-1

VIN +

-V

VIN

VOUT

VSS

V

Cmos Output

2

A

VIN +

-

VIN

VOUT

VSS

CMOS IC

100kΩ

1-2

VIN +

-V

VIN

VOUT

VSS

V

N-channel Open Drain Output

3

VIN

VOUT

A

VIN +

Vss

-

VDS

+

-

4

VIN

VOUT

A

VIN +

Vss

-

+ VDS

-

5-1

VIN

VIN

VOUT

Vss

Measurement

waveform

5-2

100kΩ

VIN

VOUT

VIN

Measurement

Vss

waveform

Cmos Output

N-channel Open Drain Output

UNISONIC TECHNOLOGIES CO., LTD

www.unisonic.com.tw

7 of 15

QW-R502-039,I

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