CY7C261-25JC 데이터 시트보기 (PDF) - Cypress Semiconductor

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CY7C261-25JC

8K x 8 Power-Switched and Reprogrammable PROM

Cypress Semiconductor 

CY7C261

CY7C263/CY7C264

Electrical Characteristics Over the Operating Range[3,4]

Parameter

Description

Test Conditions

VOH

Output HIGH Voltage

VOH

Output HIGH Voltage

VOL

Output LOW Voltage

VCC = Min., IOH = –2.0 mA

VCC = Min., IOH = –4.0 mA

VCC = Min., IOL = 8 mA

(6 mA Mil)

VOL

Output LOW Voltage

VCC = Min., IOL = 16 mA

VIH

Input HIGH Level

VIL

Input LOW Level

IIX

Input Current

GND < VIN < VCC

VCD

Input Diode Clamp Voltage

IOZ

Output Leakage Current

GND < VOUT < VCC

Output Disabled

Com’l

Mil

IOS

Output Short Circuit Current[5]

VCC = Max., VOUT = GND

ICC

Power Supply Current

VCC = Max., f = Max.

IOUT = 0 mA

Com’l

Mil

ISB

Standby Supply Current (7C261) VCC = Max.,

CS > VIH

Com’l

Mil

VPP

Programming Supply Voltage

IPP

Programming Supply Current

VIHP

Input HIGH Programming Voltage

VILP

Input LOW Programming Voltage

7C261-20, 25

7C263-20, 25

7C264-20, 25

Min. Max.

2.4

0.4

7C261-35, 45, 55

7C263-35, 45, 55

7C264-35, 45, 55

Min. Max. Unit

V

2.4

V

V

2.0

0.8

–10 +10

Note 4

–10 +10

–40 +40

–20 –90

120

140

40

40

12

13

50

4.75

0.4

0.4

V

2.0

V

0.8

V

–10

+10 µA

Note 4

–10

+10 µA

–40

+40 µA

–20

–90 mA

100 mA

120

30

mA

30

12

13

V

50

mA

4.75

V

0.4

V

Capacitance[4]

Parameter

CIN

COUT

Description

Input Capacitance

Output Capacitance

Test Conditions

TA = 25°C, f = 1 MHz,

VCC = 5.0V

Max.

Unit

10

pF

10

pF

Notes

3. See the last page of this specification for Group A subgroup testing information.

4. See the “Introduction to CMOS PROMs” section of the Cypress Data Book for general information on testing.

5. For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.

Document #: 38-04010 Rev. *C

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