NXP Semiconductors
HEF4051B
8-channel analog multiplexer/demultiplexer
VDD
VDD or VSS
VSS
S1 to S3
Z
E
fi
Y0 1
Yn 2
switch
VSS = VEE
RL
CL dB
Fig 19. Test circuit for measuring isolation (OFF-state)
001aak518
a. Test circuit
9''
9''
9''
5/
6WR6
=
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9''RU966
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<Q
5/
VZLWFK
966 9((
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9 92
DDN
ORJLF
RII
RQ
RII
LQSXW6Q(
92
9FW
DDM
b. Input and output pulse definitions
Fig 20. Test circuit for measuring crosstalk voltage between digital inputs and switch
HEF4051B
Product data sheet
All information provided in this document is subject to legal disclaimers.
Rev. 11 — 11 September 2014
© NXP Semiconductors N.V. 2014. All rights reserved.
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