100304PC 데이터 시트보기 (PDF) - Fairchild Semiconductor

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100304PC

Low Power Quint AND/NAND Gate

Fairchild Semiconductor 

Absolute Maximum Ratings(Note 1)

Storage Temperature (TSTG)

−65°C to +150°C

Maximum Junction Temperature (TJ)

+150°C

VEE Pin Potential to Ground Pin

−7.0V to +0.5V

Input Voltage (DC)

VEE to +0.5V

Output Current (DC Output HIGH)

−50 mA

ESD (Note 2)

≥2000V

Commercial Version

Recommended Operating

Conditions

Case Temperature (TC)

Commercial

0°C to +85°C

Industrial

−40°C to +85°C

Supply Voltage (VEE)

−5.7V to −4.2V

Note 1: The “Absolute Maximum Ratings” are those values beyond which

the safety of the device cannot be guaranteed. The device should not be

operated at these limits. The parametric values defined in the Electrical

Characteristics tables are not guaranteed at the absolute maximum rating.

The “Recommended Operating Conditions” table will define the conditions

for actual device operation.

Note 2: ESD testing conforms to MIL-STD-883, Method 3015.

DC Electrical Characteristics (Note 3)

VEE = −4.2V to −5.7V, VCC = VCCA = GND, TC = 0°C to +85°C

Symbol

Parameter

Min

Typ

Max

Units

Conditions

VOH

VOL

VOHC

VOLC

VIH

Output HIGH Voltage

Output LOW Voltage

Output HIGH Voltage

Output LOW Voltage

Input HIGH Voltage

−1025

−1830

−1035

−1165

−955

−1705

−870

−1620

−1610

−870

mV

VIN =VIH (Max)

mV

or VIL (Min)

mV

VIN = VIH(Min)

mV or VIL (Max)

mV Guaranteed HIGH Signal

for All Inputs

Loading with

50Ω to −2.0V

Loading with

50Ω to −2.0V

VIL

Input LOW Voltage

−1830

−1475

mV Guaranteed LOW Signal

for All Inputs

IIL

Input LOW Current

0.50

µA

VIN = VIL (Min)

IIH

Input High Current

D2a–D2e

250

µA VIN = VIH(Max)

D1a–D1e

350

IEE

Power Supply Current

−69

−43

−30

mA Inputs open

Note 3: The specified limits represent the “worst case” value for the parameter. Since these values normally occur at the temperature extremes, additional

noise immunity and guardbanding can be achieved by decreasing the allowable system operating ranges. Conditions for testing shown in the tables are cho-

sen to guarantee operation under “worst case” conditions.

DIP AC Electrical Characteristics

VEE = −4.2V to −5.7V, VCC = VCCA = GND

Symbol

Parameter

tPLH

Propagation Delay

tPHL

Dna–Dne to O, O

tPLH

Propagation Delay

tPHL

Data to F

tTLH

Transition Time

tTHL

20% to 80%, 80% to 20%

TC = 0°C

Min

Max

0.40

1.75

1.00

2.60

0.35

1.20

TC = +25°C

Min

Max

0.40

1.65

1.00

2.60

0.35

1.20

TC = +85°C

Min

Max

0.40

1.75

1.15

3.20

0.35

1.20

Units

Conditions

ns

ns Figures 1, 2

ns

PLCC AC Electrical Characteristics

VEE = −4.2V to −5.7V, VCC = VCCA = GND

Symbol

Parameter

tPLH

Propagation Delay

tPHL

Dna–Dne to O, O

tPLH

Propagation Delay

tPHL

Data to F

tTLH

Transition Time

tTHL

20% to 80%, 80% to 20%

TC = 0°C

Min

Max

0.40

1.55

1.00

2.40

0.35

1.10

TC = +25°C

Min

Max

0.40

1.45

1.00

2.40

0.35

1.15

TC = +85°C

Min

Max

0.40

1.55

1.15

3.00

0.35

1.10

Units

Conditions

ns

ns Figures 1, 2

ns

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